Mahfuzul Islam's personal webpage


Journal Publications

  1. A. K. M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, "Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement," IEEE Transactions on Semiconductor Manufacturing, vol.PP, no.99, pp.1-1, 2017.
  2. A. K. M. Mahfuzul Islam, M. Hamamatsu, T. Yokota, S. Lee, W. Yukita, M. Takamiya, T. Someya and T. Sakurai, "Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors," IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. 7, no. 1, pp. 81-91, March 2017.
  3. A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera, "Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring," IEEE Journal of Solid State Circuits, vol. 50, no. 11, pp. 2475-2490, 2015.
  4. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations," Japanese Journal of Applied Physics, vol. 53, no. 4S, pp. 04EE08, 2014.
  5. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation," IEICE Transactions on Information and Systems, vol. E96-D, no. 9, pp. 1971-1979, 2013.
  6. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera, "Inhomogeneous Ring Oscillator for Within-Die Variability and RTN Characterization," IEEE Transactions on Semiconductor Manufacturing, vol. 26, no. 3, pp. 296-305, 2013.
  7. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, "Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation," IEEE Transactions on Semiconductor Manufacturing, vol. 25, no. 4, pp. 571-580, 2012.

Conference Publications (International)

  1. A.K.M. Mahfuzul Islam, and Hidetoshi Ondoera, "Effect of Supply Voltage on Random Telegraph Noise of Transistors under Switching Condition" International Symposium on Power and Timing Modeling, Optimization and Simulation, pp. , Sep. 2017. (to appear)
  2. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Ondoera, "A Statistical Modeling Methodology of RTN Gate Size Dependency Based on Skewed Ring Oscillators," IEEE International Conference on Microelectronic Test Structure, pp. , March 2017. (Best paper award)
  3. A.K.M. Mahfuzul Islam, Hiroshi Fuketa, Koichi Ishida, Tomoyuki Yokota, Tsuyoshi Sekitani, Makoto Takamiya,Takao Someya, and Takayasu Sakurai, "Sensor and Circuit Solutions for Organic Flexible Electronics," in Society for Information Display Symposium Digest of Technical Papers, pp. 629-632, May. 2016.
  4. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, "Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Variation Measurement," in IEEE International Conference on Microelectronic Test Structures, pp. 82-87, Mar. 2016.
  5. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "On-chip Monitoring and Compensation Scheme with Fine-grain Body Biasing for Robust and Energy-Efficient Operations," in IEEE Asia and South Pacific Design Automation Conference, Jan. 2016. pp. 403-407.
  6. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, "Characterization of Gate Width Dependency on Random Telegraph Noise using Reconfigurable Ring Oscillator for Compact Statistical Modeling," in IEEE/ACM Workshop on Variability Modeling and Characterization, Nov. 2015.
  7. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "Sensitivity-Independent Extraction of Vth Variation Utilizing Log-normal Delay Distribution," in IEEE International Conference on Microelectronic Test Structures, Mar. 2015. pp. 212-217.
  8. Norihiro Kamae, A.K.M. Mahfuzul Islam, Akira Tsuchiya, Tohru Ishihara, and Hidetoshi Onodera, "Energy Reduction by Built-in Body Biasing with Single Supply Voltage Operation," in 16th International Symposium on Quality Electronic Design, Mar. 2015, pp. 181-185.
  9. A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera, "Wide-Supply- Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring," in IEEE Asian Solid-State Circuits Conference, Nov. 2014, pp. 45-48.
  10. Norihiro Kamae, A.K.M. Mahfuzul Islam, Akira Tsuchiya, Tohru Ishihara, and Hidetoshi Onodera, "Body Bias Generator with Wide Supply-Range Down to Threshold Voltage for Within-Die Variability Compensation," in IEEE Asian Solid-State Circuits Conference, Nov. 2014, pp. 53-56.
  11. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "Characterization and Compensation of Performance Variability Using On-chip Monitors," in IEEE International Symposium on VLSI Design, Automation and Test, Apr. 2014. (Invited)
  12. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "In-Situ Variability Characterization of Individual Transistors using Topology-Reconfigurable Ring Oscillators," in IEEE International Conference on Microelectronic Test Structures, Mar. 2014, pp. 121-126.
  13. A.K.M. Mahfuzul Islam, Tohru Ishihara, and Hidetoshi Onodera, "Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes," in IEEE Asian Solid State Circuits Conference, Nov. 2013, pp. 125-128.
  14. A.K.M. Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, "Energy-efficient Dynamic Voltage and Frequency Scaling by P/N-performance Self-adjustment using Adaptive Body Bias," in Proceedings of SASIMI, Oct. 2013.
  15. A. K. M. Mahfuzul Islam, and Hidetoshi Onodera, "Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations," in International Conference on Solid State Devices and Materials, Sep. 2013, pp. 132-133.
  16. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation," in IEEE Asian Test Symposium, 2012, pp. 350-354.
  17. A.K.M Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, "A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits," in IEEE Asian Solid State Circuits Conference, Nov. 2012, pp. 101-104.
  18. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera, "Inhomogeneous Ring Oscillator for WID Variability and RTN Characterization," in IEEE International Conference on Microelectronic Test Structures, Mar. 2012, pp. 25-30.
  19. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, "Variation-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variation," in IEEE International Conference on Microelectronic Test Structures, Apr. 2011, pp. 153-157.
  20. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Shinichi Nishizawa, and Hidetoshi Onodera, "Component Analysis of WID Variation," in IEEE International Workshop on Design for Manufacturability & Yield, May 2010.
  21. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, "Process-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variability," in ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, Mar. 2010, pp. 83-88.

Invited Talk

  1. A.K.M. Mahfuzul Islam, "Area-efficient Sensors for On-chip Monitoring of Process, Leakage and Temperature Variation," IEEE/ACM Workshop on Variability Modeling and Characterization, Nov. 2014. 2013.

On-site Demonstration

  1. A.K.M. Mahfuzul Islam, Tohru Ishihara, and Hidetoshi Onodera, "Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes," in Student Design Contest of IEEE Asian Solid State Circuits Conference, Nov. 2013.
  2. Norihiro Kamae, A.K.M. Mahfuzul Islam, Tohru Ishihara, and Hidetoshi Onodera, "Postsilicon P/N-performance Compensation Scheme Compatible with Cell-based Design," in University Booth of IEEE Design, Automation and Test in Europope, Mar. 2013.
  3. A.K.M. Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, "A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits," in Student Design Contest of IEEE Asian Solid State circuits Conference, Nov. 2012.

Patent

  1. Onodera, Hidetoshi, and Islam AKM Mahfuzul. "Reconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method." U.S. Patent Application No. 14/913,309. APA
  2. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, "Delay Circuits for Delay Monitor Circuits and Delay Monitor Circuits for signal-propagation-time measurements in integrated circuits," Japan Patent Application Number 2013-169965.